Cover Picture: Direct Correlation of Organic Semiconductor Film Structure to Field-Effect Mobility (Adv. Mater. 19/2005

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The use of near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a non-destructive technique to quantify the simultaneous chemical conversion, molecular ordering, and defect formation of soluble oligothiophene precursor films intended
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  ADVMEWISSN 0935-9648Vol. 17, No. 19October 4, 2005D10488 OURNEWSISTERJOURNAL www.small-journal.com Light-Emitting PolythiophenesBlood-Compatible Surfaces on Hydrophobic PolymersFluorescent Silver Nanoclusters in Polymer Microgels Correlating OFET Film Structure to Field-Effect Mobility 
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